Trap Level Spectroscopy in Amorphous Semiconductors
Victor V. Mikla, Victor I Mikla
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscopic techniquesDiscusses the advantages and disadvantages of each technique
Κατηγορίες:
Έτος:
2010
Έκδοση:
1
Εκδότης:
Elsevier
Γλώσσα:
english
Σελίδες:
128
ISBN 10:
0123847168
ISBN 13:
9780123847164
Αρχείο:
PDF, 1.48 MB
IPFS:
,
english, 2010